Characterization of Single Crystal Films of Molybdenum
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- Category: Molybdenum knowledge
- Published on 01 August 2013
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Films of molybdenum grown on the (112 over-bar 0) plane of sapphire (Al2O3) are characterized using low-energy microscopy and low-energy electron diffraction.
Stress fields observed on the Mo surface originate at dislocations and at miscut steps of t%he buried molybdenum-alumina vicinal interface.
As-grown films contain small-angle grain boundaries. These are largely eliminated upon heating to 1700 K as edge dislocations that form the boundaries become extremely mobile.
Edge dislocations attractand annihilate one another, and the small-angle grain boundaries disappear. Mobility of edge dislocations is correlated with rapid diffusion of carbon.
Which apparently pins dislocations up to temperatures that allow diffusion of carbon from dislocations into the bulk.
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